Improved Software Defect Prediction with Gated Tab Transformer
Vol. 52, No. 3, pp. 196-207, Mar. 2025

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Cite this article
[IEEE Style]
S. Manikandan and D. Ryu, "Improved Software Defect Prediction with Gated Tab Transformer," Journal of KIISE, JOK, vol. 52, no. 3, pp. 196-207, 2025. DOI: 10.5626/JOK.2025.52.3.196.
[ACM Style]
Saranya Manikandan and Duksan Ryu. 2025. Improved Software Defect Prediction with Gated Tab Transformer. Journal of KIISE, JOK, 52, 3, (2025), 196-207. DOI: 10.5626/JOK.2025.52.3.196.
[KCI Style]
마니칸단 사란야, 류덕산, "Gated Tab Transformer를 사용한 향상된 소프트웨어 결함 예측," 한국정보과학회 논문지, 제52권, 제3호, 196~207쪽, 2025. DOI: 10.5626/JOK.2025.52.3.196.
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