VirtIO-trace: An Unified Tool for Analyzing I/O Characteristics on NVMe SSD in Virtualized Environments
Vol. 45, No. 4, pp. 332-341, Apr. 2018

Abstract
Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.
|
Cite this article
[IEEE Style]
S. Kim and J. Choi, "VirtIO-trace: An Unified Tool for Analyzing I/O Characteristics on NVMe SSD in Virtualized Environments," Journal of KIISE, JOK, vol. 45, no. 4, pp. 332-341, 2018. DOI: 10.5626/JOK.2018.45.4.332.
[ACM Style]
Sewoog Kim and Jongmoo Choi. 2018. VirtIO-trace: An Unified Tool for Analyzing I/O Characteristics on NVMe SSD in Virtualized Environments. Journal of KIISE, JOK, 45, 4, (2018), 332-341. DOI: 10.5626/JOK.2018.45.4.332.
[KCI Style]
김세욱, 최종무, "VirtIO-trace: 가상화 환경에서 NVMe SSD 입출력 특성 분석을 위한 통합 도구," 한국정보과학회 논문지, 제45권, 제4호, 332~341쪽, 2018. DOI: 10.5626/JOK.2018.45.4.332.
[Endnote/Zotero/Mendeley (RIS)] Download
[BibTeX] Download
Search

Journal of KIISE
- ISSN : 2383-630X(Print)
- ISSN : 2383-6296(Electronic)
- KCI Accredited Journal
Editorial Office
- Tel. +82-2-588-9240
- Fax. +82-2-521-1352
- E-mail. chwoo@kiise.or.kr