Efficient Mutation-based Fault Localization using Predictive Mutation Analysis
Vol. 52, No. 11, pp. 915-922, Nov. 2025
10.5626/JOK.2025.52.11.915
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Cite this article
[IEEE Style]
Y. Kim, N. Jung, I. Lee, H. Nam, K. Cho, "Efficient Mutation-based Fault Localization using Predictive Mutation Analysis," Journal of KIISE, JOK, vol. 52, no. 11, pp. 915-922, 2025. DOI: 10.5626/JOK.2025.52.11.915.
[ACM Style]
Yunho Kim, Namhoon Jung, Insub Lee, Hyoju Nam, and Kyutae Cho. 2025. Efficient Mutation-based Fault Localization using Predictive Mutation Analysis. Journal of KIISE, JOK, 52, 11, (2025), 915-922. DOI: 10.5626/JOK.2025.52.11.915.
[KCI Style]
김윤호, 정남훈, 이인섭, 남효주, 조규태, "변이 분석 예측을 활용한 효율적인 변이 기반 오류 위치 추정 기법," 한국정보과학회 논문지, 제52권, 제11호, 915~922쪽, 2025. DOI: 10.5626/JOK.2025.52.11.915.
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