Fine-Tuning BGE-M3 for Defense Language EmbeddingModel: The Impact of Negative Sample Selection inContrastive Learning
Vol. 53, No. 2, pp. 117-123, Feb. 2026
10.5626/JOK.2026.53.2.117
Abstract
Statistics
Cumulative Counts from November, 2022
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.
Multiple requests among the same browser session are counted as one view. If you mouse over a chart, the values of data points will be shown.
|
|
Cite this article
[IEEE Style]
J. Kim, D. Choi, S. G. Kim, D. H. Kim, "Fine-Tuning BGE-M3 for Defense Language EmbeddingModel: The Impact of Negative Sample Selection inContrastive Learning," Journal of KIISE, JOK, vol. 53, no. 2, pp. 117-123, 2026. DOI: 10.5626/JOK.2026.53.2.117.
[ACM Style]
Junsub Kim, Dongnyeok Choi, Sung Gu Kim, and Deuk Hwa Kim. 2026. Fine-Tuning BGE-M3 for Defense Language EmbeddingModel: The Impact of Negative Sample Selection inContrastive Learning. Journal of KIISE, JOK, 53, 2, (2026), 117-123. DOI: 10.5626/JOK.2026.53.2.117.
[KCI Style]
김준섭, 최동녘, 김성구, 김득화, "국방 언어 임베딩 모델을 위한 BGE-M3의미세조정: 대조학습에서 네거티브 샘플 선택이모델 성능에 미치는 영향," 한국정보과학회 논문지, 제53권, 제2호, 117~123쪽, 2026. DOI: 10.5626/JOK.2026.53.2.117.
[Endnote/Zotero/Mendeley (RIS)] Download
[BibTeX] Download
Search
Journal of KIISE
- ISSN : 2383-630X(Print)
- ISSN : 2383-6296(Electronic)
- KCI Accredited Journal
Editorial Office
- Tel. +82-2-588-9240
- Fax. +82-2-521-1352
- E-mail. chwoo@kiise.or.kr