Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules
Vol. 44, No. 2, pp. 171-178, Feb. 2017
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Cite this article
[IEEE Style]
Y. Kim and M. Kim, "Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules," Journal of KIISE, JOK, vol. 44, no. 2, pp. 171-178, 2017. DOI: .
[ACM Style]
Yunho Kim and Moonzoo Kim. 2017. Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules. Journal of KIISE, JOK, 44, 2, (2017), 171-178. DOI: .
[KCI Style]
김윤호, 김문주, "안드로이드 커널 모듈 취약점 탐지를 위한 자동화된 유닛 테스트 생성 기법," 한국정보과학회 논문지, 제44권, 제2호, 171~178쪽, 2017. DOI: .
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