Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules 


Vol. 44,  No. 2, pp. 171-178, Feb.  2017


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  Abstract

In this study, we propose an automated unit test generation technique for detecting vulnerabilities of Android kernel modules. The technique automatically generates unit test drivers/stubs and unit test inputs for each function of Android kernel modules by utilizing dynamic symbolic execution. To reduce false alarms caused by function pointers and missing pre-conditions of automated unit test generation technique, we develop false alarm reduction techniques that match function pointers by utilizing static analysis and generate pre-conditions by utilizing def-use analysis. We showed that the proposed technique could detect all existing vulnerabilities in the three modules of Android kernel 3.4. Also, the false alarm reduction techniques removed 44.9% of false alarms on average.


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  Cite this article

[IEEE Style]

Y. Kim and M. Kim, "Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules," Journal of KIISE, JOK, vol. 44, no. 2, pp. 171-178, 2017. DOI: .


[ACM Style]

Yunho Kim and Moonzoo Kim. 2017. Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules. Journal of KIISE, JOK, 44, 2, (2017), 171-178. DOI: .


[KCI Style]

김윤호, 김문주, "안드로이드 커널 모듈 취약점 탐지를 위한 자동화된 유닛 테스트 생성 기법," 한국정보과학회 논문지, 제44권, 제2호, 171~178쪽, 2017. DOI: .


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