A Test Scenario Generation Method from Activity Diagram with Concurrency

Seungchan Back, Hyorin Choi, Byungjeong Lee, Jung-Won Lee

http://doi.org/

Currently, software testing is becoming increasingly important in the industrial field and a large body of research supports the improvement of efficient software testing. Model-based testing is generally used to formalize user requirement data for test design. Complex system that includes loop and concurrency has a high probability of path explosion problem. Specially, as threads are added to concurrency, test scenarios have also increased exponentially. However, it is difficult to solve this problem using existing techniques. In this paper, we propose novel path-search technique that focuses on behavioral features of concurrency path in order to avoid path explosion problem. A system that contains concurrent paths is represented by activity diagram in case study section. Efficiency of our study is shown through comparison with several generated test scenarios of other studies. The result indicate that our approach is efficient for finding faults in loop and concurrency with fewer test scenario.