Digital Library[ Search Result ]
OS-in-the-Loop Concolic Testing for Multitask Embedded Software
http://doi.org/10.5626/JOK.2023.50.2.140
Verification of multitask embedded software still depends on manual effort because of its hardware-dependent structure and complicated multitasking works. We present the OSin-the-loop(OiL) concolic test, the new approach for automatic and efficient verification of multitask embedded software. Given the OS model, hardware stubs that replace platform-dependent code, and annotated application code with explicit context switch control logic, it provides a hardwareindependent environment and automatically checks properties with the concolic test. In the application of our approach on a representative multitask embedded software, Object-Follower and concolic testing tool CROWN 2.0, when there is an OS model, our method achieves fewer false alarms from 91.67% to 5.13% than without OS.
Incremental and Automated Mock Generation using Execution Logs for the Abstraction of Embedded Software Modules
http://doi.org/10.5626/JOK.2022.49.12.1088
One of the barriers to applying verification methods, such as dynamic tests, static analysis, and model checking, to unit modules is constructing the verification environment, including external components developed by third parties. Current practices replace such external components with manual stubs. This requires time and effort and suffers from inaccuracy of the stubs, resulting in low verification efficiency. This work proposes a log-based automated mock generation approach using the Program-By-Example (PBE) synthesis method and performed experimental analysis of its efficiency and accuracy. The suggested method is an incremental mock synthesis method under the condition that the source code or the specification of the target component does not exist. Through a set of experiments, this study demonstrated that log-based incremental mock generation could achieve accuracy and efficiency comparable to the ideal case where oracles exist.
Design and Implementation of a Concurrency Error Detection Method for Embedded Software Using Machine Learning
Dongeon Lee, Jiwon Kim, Junghun Jin, Kyutae Cho
http://doi.org/10.5626/JOK.2022.49.5.327
Unlike general-purpose software, embedded software is designed by optimizing hardware for a specific purpose, so it is important to satisfy the target performance in a limited environment. Embedded software is increasing significantly in scale and complexity compared to the past. As the scale and complexity increase, the types of errors that occur in the software also diversify. Among them, there are many issues regarding concurrency errors that may occur between complex software modules. To detect concurrency errors in such embedded software, we have previously relied on manual input from the user. However, in this study, we propose a machine learning-based concurrency error detection tool (MCED) using SVM and deep learning.
Efficient Test Method for Embedded Software Using Next Software Framework Test Service
Dongeon Lee, Hyunggon Song, Junghun Jin, Kyutae Cho
http://doi.org/10.5626/JOK.2020.47.9.804
In recent years, it has become difficult to maintain the software quality and reliability of embedded software as its size and complexity have increased significantly unlike in the past. To improve such software quality and reliability, the most important factor is efficient testing of the software. Because of the nature of embedded software, it is difficult to apply existing test automation tools mainly used for Windows or Linux in general-purpose systems because of the high coupling with hardware and various platforms. In general, when developing software and hardware together, the number of hardware that can be operated is also minimal compared to the number of software developers. In this paper, we propose a method for the efficient testing of embedded software using NSFW(Next Software Framework) test service. Additionally, this paper suggests a method to test concurrency errors more efficiently.
Effective Integer Promotion Bug Detection Technique for Embedded Software
Yunho Kim, Taejin Kim, Moonzoo Kim, Ho-jung Lee, Hoon Jang, Mingyu Park
C compilers for 8-bit MCUs used in washing machines and refrigerators often do not follow the C standard to improve runtime performance. Developers who are unaware of the difference between C compilers following the C standard and the C compilers for 8-bit MCU can cause bugs that do not appear in the standard C environment but appear in the embedded systems using 8-bit MCUs. It is difficult for bug detectors that assume the standard C environment to detect such bugs. In this paper, we introduce integer promotion bugs caused by the different integer promotion rules of the C compilers for 8-bit MCU from the C standard and propose 5 bug patterns where the integer promotion bugs occur. We have developed an integer promotion bug detection tool and applied it to the washing machine control software developed by the LG electronics. The integer promotion bug detection tool successfully detected 27 integer promotion bugs in the washing machine control software.
A Study on Quality Assurance of Embedded Software Source Codes for Weapon Systems by Improving the Reliability Test Process
Kyeong Yong Kwon, Joon Seok Joo, Tae Sik Kim, Jin Woo Oh, Ji Hyun Baek
In the defense field, weapon systems are increasing in importance, as well as the weight of the weapon system embedded software development as an advanced technology. As the development of a network-centric warfare has become important to secure the reliability and quality of embedded software in modern weapons systems in battlefield situations. Also, embedded software problems are transferred to the production stage in the development phase and the problem gives rise to an enormous loss at the national level. Furthermore, development companies have not systematically constructed a software reliability test. This study suggests that approaches about a quality-verification- system establishment of embedded software, based on a variety of source code reliability test verification case analysis.
Search
Journal of KIISE
- ISSN : 2383-630X(Print)
- ISSN : 2383-6296(Electronic)
- KCI Accredited Journal
Editorial Office
- Tel. +82-2-588-9240
- Fax. +82-2-521-1352
- E-mail. chwoo@kiise.or.kr