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Automated Unit-test Generation for Detecting Vulnerabilities of Android Kernel Modules
In this study, we propose an automated unit test generation technique for detecting vulnerabilities of Android kernel modules. The technique automatically generates unit test drivers/stubs and unit test inputs for each function of Android kernel modules by utilizing dynamic symbolic execution. To reduce false alarms caused by function pointers and missing pre-conditions of automated unit test generation technique, we develop false alarm reduction techniques that match function pointers by utilizing static analysis and generate pre-conditions by utilizing def-use analysis. We showed that the proposed technique could detect all existing vulnerabilities in the three modules of Android kernel 3.4. Also, the false alarm reduction techniques removed 44.9% of false alarms on average.
Effective Integer Promotion Bug Detection Technique for Embedded Software
Yunho Kim, Taejin Kim, Moonzoo Kim, Ho-jung Lee, Hoon Jang, Mingyu Park
C compilers for 8-bit MCUs used in washing machines and refrigerators often do not follow the C standard to improve runtime performance. Developers who are unaware of the difference between C compilers following the C standard and the C compilers for 8-bit MCU can cause bugs that do not appear in the standard C environment but appear in the embedded systems using 8-bit MCUs. It is difficult for bug detectors that assume the standard C environment to detect such bugs. In this paper, we introduce integer promotion bugs caused by the different integer promotion rules of the C compilers for 8-bit MCU from the C standard and propose 5 bug patterns where the integer promotion bugs occur. We have developed an integer promotion bug detection tool and applied it to the washing machine control software developed by the LG electronics. The integer promotion bug detection tool successfully detected 27 integer promotion bugs in the washing machine control software.
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